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Quantitative impedance measurement using atomic force microscopy.

Bibliographic Details
Main Authors:	O'Hayre, Ryan., Feng, Gang., Nix, William., Prinz, Fritz.
Format:	Villanova Faculty Authorship
Language:	English
Published:	2004
Online Access:	http://ezproxy.villanova.edu/login?url=https://digital.library.villanova.edu/Item/vudl:176158

Main Authors:

O'Hayre, Ryan., Feng, Gang., Nix, William., Prinz, Fritz.

Format:

Villanova Faculty Authorship

Language:

English

Published:

2004

Online Access:

http://ezproxy.villanova.edu/login?url=https://digital.library.villanova.edu/Item/vudl:176158

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spelling	Quantitative impedance measurement using atomic force microscopy. O'Hayre, Ryan. Feng, Gang. Nix, William. Prinz, Fritz. Obtaining quantitative electrical information with scanning probe microscopy techniques poses a significant challenge since the nature of the probe/sample contact is frequently unkown. For example, obtaining quantitative kinetic data from the recently developed atomic force microscopy (AFM) impedance technique requires normalization by the probe/sample contact area. In this paper, a methodology is proposed that enables the extraction of quantitative information from the AFM impedance technique. This methodology applies results from nanoindentation experiments and contact mechanics theory to characterize AFM probe contacts. Using these results, probe/sample contact forces (which can be accurately measured in the AFM) may be converted into probe/sample contact area estimates. These contact area estimates, when included in model of the probe/sample contact, enable the extraction of quantitative data. This methodology is applied to the recently developed AFM impedance measurement technique, enabling a quantitative study of the oxygen reduction reaction (ORR) at nanometer length scales. Using the AFM impedance system, kinetic data for the (ORR) at nanoscale Platinum/Nafion contacts is extracted. The kinetic data obtained from the AFM impedance technique match previous bulk measurements-affirming the technique's quantitative potential. 2004 Villanova Faculty Authorship vudl:176158 Journal of Applied Physics 96(6), September 15, 2004, 3540-3549. en
dc.title_txt_mv	Quantitative impedance measurement using atomic force microscopy.
dc.creator_txt_mv	O'Hayre, Ryan. Feng, Gang. Nix, William. Prinz, Fritz.
dc.description_txt_mv	Obtaining quantitative electrical information with scanning probe microscopy techniques poses a significant challenge since the nature of the probe/sample contact is frequently unkown. For example, obtaining quantitative kinetic data from the recently developed atomic force microscopy (AFM) impedance technique requires normalization by the probe/sample contact area. In this paper, a methodology is proposed that enables the extraction of quantitative information from the AFM impedance technique. This methodology applies results from nanoindentation experiments and contact mechanics theory to characterize AFM probe contacts. Using these results, probe/sample contact forces (which can be accurately measured in the AFM) may be converted into probe/sample contact area estimates. These contact area estimates, when included in model of the probe/sample contact, enable the extraction of quantitative data. This methodology is applied to the recently developed AFM impedance measurement technique, enabling a quantitative study of the oxygen reduction reaction (ORR) at nanometer length scales. Using the AFM impedance system, kinetic data for the (ORR) at nanoscale Platinum/Nafion contacts is extracted. The kinetic data obtained from the AFM impedance technique match previous bulk measurements-affirming the technique's quantitative potential.
dc.date_txt_mv	2004
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dc.language_txt_mv	en
author	O'Hayre, Ryan. Feng, Gang. Nix, William. Prinz, Fritz.
spellingShingle	O'Hayre, Ryan. Feng, Gang. Nix, William. Prinz, Fritz. Quantitative impedance measurement using atomic force microscopy.
author_facet	O'Hayre, Ryan. Feng, Gang. Nix, William. Prinz, Fritz.
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description	Obtaining quantitative electrical information with scanning probe microscopy techniques poses a significant challenge since the nature of the probe/sample contact is frequently unkown. For example, obtaining quantitative kinetic data from the recently developed atomic force microscopy (AFM) impedance technique requires normalization by the probe/sample contact area. In this paper, a methodology is proposed that enables the extraction of quantitative information from the AFM impedance technique. This methodology applies results from nanoindentation experiments and contact mechanics theory to characterize AFM probe contacts. Using these results, probe/sample contact forces (which can be accurately measured in the AFM) may be converted into probe/sample contact area estimates. These contact area estimates, when included in model of the probe/sample contact, enable the extraction of quantitative data. This methodology is applied to the recently developed AFM impedance measurement technique, enabling a quantitative study of the oxygen reduction reaction (ORR) at nanometer length scales. Using the AFM impedance system, kinetic data for the (ORR) at nanoscale Platinum/Nafion contacts is extracted. The kinetic data obtained from the AFM impedance technique match previous bulk measurements-affirming the technique's quantitative potential.
title	Quantitative impedance measurement using atomic force microscopy.
title_full	Quantitative impedance measurement using atomic force microscopy.
title_fullStr	Quantitative impedance measurement using atomic force microscopy.
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Quantitative impedance measurement using atomic force microscopy.
O'Hayre, Ryan.
Feng, Gang.
Nix, William.
Prinz, Fritz.
Obtaining quantitative electrical information with scanning probe microscopy techniques poses a significant challenge since the nature of the probe/sample contact is frequently unkown. For example, obtaining quantitative kinetic data from the recently developed atomic force microscopy (AFM) impedance technique requires normalization by the probe/sample contact area. In this paper, a methodology is proposed that enables the extraction of quantitative information from the AFM impedance technique. This methodology applies results from nanoindentation experiments and contact mechanics theory to characterize AFM probe contacts. Using these results, probe/sample contact forces (which can be accurately measured in the AFM) may be converted into probe/sample contact area estimates. These contact area estimates, when included in model of the probe/sample contact, enable the extraction of quantitative data. This methodology is applied to the recently developed AFM impedance measurement technique, enabling a quantitative study of the oxygen reduction reaction (ORR) at nanometer length scales. Using the AFM impedance system, kinetic data for the (ORR) at nanoscale Platinum/Nafion contacts is extracted. The kinetic data obtained from the AFM impedance technique match previous bulk measurements-affirming the technique's quantitative potential.
2004
Villanova Faculty Authorship
vudl:176158
Journal of Applied Physics 96(6), September 15, 2004, 3540-3549.
en

dc.title_txt_mv

Quantitative impedance measurement using atomic force microscopy.

dc.creator_txt_mv

O'Hayre, Ryan.
Feng, Gang.
Nix, William.
Prinz, Fritz.

dc.description_txt_mv

Obtaining quantitative electrical information with scanning probe microscopy techniques poses a significant challenge since the nature of the probe/sample contact is frequently unkown. For example, obtaining quantitative kinetic data from the recently developed atomic force microscopy (AFM) impedance technique requires normalization by the probe/sample contact area. In this paper, a methodology is proposed that enables the extraction of quantitative information from the AFM impedance technique. This methodology applies results from nanoindentation experiments and contact mechanics theory to characterize AFM probe contacts. Using these results, probe/sample contact forces (which can be accurately measured in the AFM) may be converted into probe/sample contact area estimates. These contact area estimates, when included in model of the probe/sample contact, enable the extraction of quantitative data. This methodology is applied to the recently developed AFM impedance measurement technique, enabling a quantitative study of the oxygen reduction reaction (ORR) at nanometer length scales. Using the AFM impedance system, kinetic data for the (ORR) at nanoscale Platinum/Nafion contacts is extracted. The kinetic data obtained from the AFM impedance technique match previous bulk measurements-affirming the technique's quantitative potential.

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2004

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Journal of Applied Physics 96(6), September 15, 2004, 3540-3549.

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O'Hayre, Ryan.
Feng, Gang.
Nix, William.
Prinz, Fritz.

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O'Hayre, Ryan.
Feng, Gang.
Nix, William.
Prinz, Fritz.
Quantitative impedance measurement using atomic force microscopy.

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Feng, Gang.
Nix, William.
Prinz, Fritz.

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Quantitative impedance measurement using atomic force microscopy.

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