GaN-Based High Electron-Mobility Transistors for Microwave and RF Control Applications.
Heterojunction FETs or high electron-mobility transistors (HEMTs) based on AlxGa1-xN/GaN are studied for their use as control components for high-power microwave and RF control devices (switches, phase-shifters, etc.). A linear operation model was developed for these components so that optimum trans...
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GaN-Based High Electron-Mobility Transistors for Microwave and RF Control Applications. Drozdovski, Nikolai V. Caverly, Robert H. Heterojunction FETs or high electron-mobility transistors (HEMTs) based on AlxGa1-xN/GaN are studied for their use as control components for high-power microwave and RF control devices (switches, phase-shifters, etc.). A linear operation model was developed for these components so that optimum transistor geometry and operation parameters may be determined for their use in control applications. The model was verified with experimental data taken on test HEMT devices. It was experimentally established that the HEMT resistance is low for voltages of +1.0 V, and that the capacitive reactance increases for dc gate voltages below the threshold voltage of approximately -1.5 V. 2002 Villanova Faculty Authorship vudl:175361 IEEE Transactions on Microwave Theory and Techniques 50(1), January 2002, 4-8. en |
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GaN-Based High Electron-Mobility Transistors for Microwave and RF Control Applications. |
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Drozdovski, Nikolai V. Caverly, Robert H. |
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Heterojunction FETs or high electron-mobility transistors (HEMTs) based on AlxGa1-xN/GaN are studied for their use as control components for high-power microwave and RF control devices (switches, phase-shifters, etc.). A linear operation model was developed for these components so that optimum transistor geometry and operation parameters may be determined for their use in control applications. The model was verified with experimental data taken on test HEMT devices. It was experimentally established that the HEMT resistance is low for voltages of +1.0 V, and that the capacitive reactance increases for dc gate voltages below the threshold voltage of approximately -1.5 V. |
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2002 |
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Villanova Faculty Authorship |
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IEEE Transactions on Microwave Theory and Techniques 50(1), January 2002, 4-8. |
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Drozdovski, Nikolai V. Caverly, Robert H. |
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Drozdovski, Nikolai V. Caverly, Robert H. GaN-Based High Electron-Mobility Transistors for Microwave and RF Control Applications. |
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Drozdovski, Nikolai V. Caverly, Robert H. |
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IEEE Transactions on Microwave Theory and Techniques 50(1), January 2002, 4-8. |
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Drozdovski, Nikolai V. |
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2002 |
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GaN-Based High Electron-Mobility Transistors for Microwave and RF Control Applications. |
description |
Heterojunction FETs or high electron-mobility transistors (HEMTs) based on AlxGa1-xN/GaN are studied for their use as control components for high-power microwave and RF control devices (switches, phase-shifters, etc.). A linear operation model was developed for these components so that optimum transistor geometry and operation parameters may be determined for their use in control applications. The model was verified with experimental data taken on test HEMT devices. It was experimentally established that the HEMT resistance is low for voltages of +1.0 V, and that the capacitive reactance increases for dc gate voltages below the threshold voltage of approximately -1.5 V. |
title |
GaN-Based High Electron-Mobility Transistors for Microwave and RF Control Applications. |
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GaN-Based High Electron-Mobility Transistors for Microwave and RF Control Applications. |
title_fullStr |
GaN-Based High Electron-Mobility Transistors for Microwave and RF Control Applications. |
title_full_unstemmed |
GaN-Based High Electron-Mobility Transistors for Microwave and RF Control Applications. |
title_short |
GaN-Based High Electron-Mobility Transistors for Microwave and RF Control Applications. |
title_sort |
gan-based high electron-mobility transistors for microwave and rf control applications. |
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