Accurate Characterization of Cross-Over and Other Junction Discontinuities in Two-Layer Microstrip Circuits.
A mixed-potential spatial-domain integral equation approach is used to model the coupling and junction effects when microstrip structures in two different layers of a common substrate are crossing each other. In particular, some canonical four port and three port junctions are characterized by apply...
Main Authors: | , , |
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Format: | |
Language: | English |
Published: |
1991
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Online Access: | http://ezproxy.villanova.edu/login?url=https://digital.library.villanova.edu/Item/vudl:176923 |