Accurate Characterization of Cross-Over and Other Junction Discontinuities in Two-Layer Microstrip Circuits.

A mixed-potential spatial-domain integral equation approach is used to model the coupling and junction effects when microstrip structures in two different layers of a common substrate are crossing each other. In particular, some canonical four port and three port junctions are characterized by apply...

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Bibliographic Details
Main Authors: Hoorfar, Ahmad., Zheng, J. X., Chang, David C.
Format: Villanova Faculty Authorship
Published: 1991
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