Accurate Characterization of Cross-Over and Other Junction Discontinuities in Two-Layer Microstrip Circuits.
A mixed-potential spatial-domain integral equation approach is used to model the coupling and junction effects when microstrip structures in two different layers of a common substrate are crossing each other. In particular, some canonical four port and three port junctions are characterized by applying a Galerkin method with linear basis functions for the currents.
| Main Author: | Hoorfar, Ahmad. |
|---|---|
| Other Authors: | Zheng, J. X., Chang, David C. |
| Format: | |
| Language: | English |
| Published: |
1991
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| Online Access: |
http://ezproxy.villanova.edu/login?url=https://digital.library.villanova.edu/Item/vudl:176923 |