Accurate Characterization of Cross-Over and Other Junction Discontinuities in Two-Layer Microstrip Circuits.
A mixed-potential spatial-domain integral equation approach is used to model the coupling and junction effects when microstrip structures in two different layers of a common substrate are crossing each other. In particular, some canonical four port and three port junctions are characterized by applying a Galerkin method with linear basis functions for the currents.
|Main Author:||Hoorfar, Ahmad.|
|Other Authors:||Zheng, J. X., Chang, David C.|