Accurate Characterization of Cross-Over and Other Junction Discontinuities in Two-Layer Microstrip Circuits.

A mixed-potential spatial-domain integral equation approach is used to model the coupling and junction effects when microstrip structures in two different layers of a common substrate are crossing each other. In particular, some canonical four port and three port junctions are characterized by applying a Galerkin method with linear basis functions for the currents.

Main Author: Hoorfar, Ahmad.
Other Authors: Zheng, J. X., Chang, David C.
Language: English
Published: 1991
Online Access: http://ezproxy.villanova.edu/login?url=https://digital.library.villanova.edu/Item/vudl:176923