Holdings: Accurate Characterization of Cross-Over and Other Junction Discontinuities in Two-Layer Microstrip Circuits.

Accurate Characterization of Cross-Over and Other Junction Discontinuities in Two-Layer Microstrip Circuits.

A mixed-potential spatial-domain integral equation approach is used to model the coupling and junction effects when microstrip structures in two different layers of a common substrate are crossing each other. In particular, some canonical four port and three port junctions are characterized by apply...

Bibliographic Details
Main Authors:	Hoorfar, Ahmad., Zheng, J. X., Chang, David C.
Format:	Villanova Faculty Authorship
Language:	English
Published:	1991
Online Access:	http://ezproxy.villanova.edu/login?url=https://digital.library.villanova.edu/Item/vudl:176923

Main Authors:

Hoorfar, Ahmad., Zheng, J. X., Chang, David C.

Format:

Villanova Faculty Authorship

Language:

English

Published:

1991

Online Access:

http://ezproxy.villanova.edu/login?url=https://digital.library.villanova.edu/Item/vudl:176923

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Accurate Characterization of Cross-Over and Other Junction Discontinuities in Two-Layer Microstrip Circuits.

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Accurate Characterization of Cross-Over and Other Junction Discontinuities in Two-Layer Microstrip Circuits.

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