An automatic test pattern generation framework for combinational threshold logic networks.

We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanotechnologies, such as resonant tunneling diodes (RTDs) and quantum cellular automata (QCA), implement threshold logic. Conseq...

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Bibliographic Details
Main Authors: Gupta, Pallav., Zhang, Rui., Jha, Niraj K.
Format: Villanova Faculty Authorship
Language:English
Published: 2008
Online Access:http://ezproxy.villanova.edu/login?url=https://digital.library.villanova.edu/Item/vudl:176617