An automatic test pattern generation framework for combinational threshold logic networks.
We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanotechnologies, such as resonant tunneling diodes (RTDs) and quantum cellular automata (QCA), implement threshold logic. Conseq...
Main Authors: | , , |
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Format: | |
Language: | English |
Published: |
2008
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Online Access: | http://ezproxy.villanova.edu/login?url=https://digital.library.villanova.edu/Item/vudl:176617 |